The Abbe sine condition and the recently developed pupil astigmatism conditions provide a powerful set of relationships for describing imaging systems that are free from aberrations that have linear and quadratic dependence on field, to all orders in the pupil. We have proved both of these conditions and applied them to axisymmetric imaging systems. We now extend our approach to plane-symmetric systems. Still using Hamilton's characteristic functions, we derive the general sine conditions and the pupil astigmatism conditions that describe plane-symmetric systems that are free of all aberrations with linear and quadratic field dependence.