Interplay between nonlinearity, scan speed, damping, and electronics in frequency modulation atomic-force microscopy

Phys Rev Lett. 2002 Sep 30;89(14):146104. doi: 10.1103/PhysRevLett.89.146104. Epub 2002 Sep 16.

Abstract

Numerical simulations of the frequency modulation atomic force microscope, including the whole dynamical regulation by the electronics, show that the cantilever dynamics is conditionally stable and that there is a direct link between the frequency shift and the conservative tip-sample interaction. However, a soft coupling between the electronics and the nonlinearity of the interaction may significantly affect the damping. A resonance between the scan speed and the response time of the system can provide a simple explanation for the spatial shift and contrast inversion between topographical and damping images, and for the extreme sensitivity of the damping to a tip change.