Shaping the reflection near-field optical probe: finite domain time difference modelling and fabrication using a focused ion beam

J Microsc. 2001 Apr;202(Pt 1):45-9. doi: 10.1046/j.1365-2818.2001.00860.x.

Abstract

An optical fibre ending in a trihedral tip is proposed as a convenient probe for reflection near-field optical microscopy in emission/collection mode. Its shape is obtained by ion milling. A first example of manufacturing and numerical models using the bi-dimensional FDTD method is presented. It confirms the strong influence of the facet angle on the intensity reflected by the probe, which is predicted by a rough analysis. This method can help us to optimize the 'reflection probe' by reducing this offset signal.