A simple channelling model for HREM contrast transfer under dynamical conditions

J Microsc. 1999 Apr;194(1):112-123. doi: 10.1046/j.1365-2818.1999.00467.x.

Abstract

The application of electron channelling theory to dynamical exit wave calculations is briefly reviewed, and a comparison of channelling results with full dynamical calculations is presented. The channelling expression to the exit wave is combined with conventional imaging theory, and it is shown that a simple expression can be obtained for a dynamical contrast transfer function (D-CTF), which incorporates imaging aberrations and thickness-dependent dynamical scattering effects. The D-CTF can provide detailed insight into HREM images of a mixed cation oxide at thicknesses up to 200 Å, whereby an approximate correction for non-linear effects is utilized in the larger thickness regime.