Low-energy yield spectroscopy as a novel technique for determining band offsets: Application to the c-Si(100)/a-Si:H-heterostructure
Phys Rev Lett
.
1995 Oct 30;75(18):3352-3355.
doi: 10.1103/PhysRevLett.75.3352.
Authors
M Sebastiani
,
Di Gaspare L
,
G Capellini
,
C Bittencourt
,
F Evangelisti
PMID:
10059562
DOI:
10.1103/PhysRevLett.75.3352
No abstract available