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Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold.
Makhotkin IA, Sobierajski R, Chalupský J, Tiedtke K, de Vries G, Störmer M, Scholze F, Siewert F, van de Kruijs RWE, Milov I, Louis E, Jacyna I, Jurek M, Klinger D, Nittler L, Syryanyy Y, Juha L, Hájková V, Vozda V, Burian T, Saksl K, Faatz B, Keitel B, Plönjes E, Schreiber S, Toleikis S, Loch R, Hermann M, Strobel S, Nienhuys HK, Gwalt G, Mey T, Enkisch H. Makhotkin IA, et al. Among authors: van de kruijs rwe. J Synchrotron Radiat. 2018 Jan 1;25(Pt 1):77-84. doi: 10.1107/S1600577517017362. Epub 2018 Jan 1. J Synchrotron Radiat. 2018. PMID: 29271755 Free PMC article.
Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser.
Milov I, Makhotkin IA, Sobierajski R, Medvedev N, Lipp V, Chalupský J, Sturm JM, Tiedtke K, de Vries G, Störmer M, Siewert F, van de Kruijs R, Louis E, Jacyna I, Jurek M, Juha L, Hájková V, Vozda V, Burian T, Saksl K, Faatz B, Keitel B, Plönjes E, Schreiber S, Toleikis S, Loch R, Hermann M, Strobel S, Nienhuys HK, Gwalt G, Mey T, Enkisch H, Bijkerk F. Milov I, et al. Opt Express. 2018 Jul 23;26(15):19665-19685. doi: 10.1364/OE.26.019665. Opt Express. 2018. PMID: 30114137 Free article.
A semi-analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescence.
Nikolaev KV, Soltwisch V, Hönicke P, Scholze F, de la Rie J, Yakunin SN, Makhotkin IA, van de Kruijs RWE, Bijkerk F. Nikolaev KV, et al. Among authors: van de kruijs rwe. J Synchrotron Radiat. 2020 Mar 1;27(Pt 2):386-395. doi: 10.1107/S1600577519016345. Epub 2020 Feb 11. J Synchrotron Radiat. 2020. PMID: 32153277 Free PMC article.
Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure.
Khorsand AR, Sobierajski R, Louis E, Bruijn S, van Hattum ED, van de Kruijs RW, Jurek M, Klinger D, Pelka JB, Juha L, Burian T, Chalupsky J, Cihelka J, Hajkova V, Vysin L, Jastrow U, Stojanovic N, Toleikis S, Wabnitz H, Tiedtke K, Sokolowski-Tinten K, Shymanovich U, Krzywinski J, Hau-Riege S, London R, Gleeson A, Gullikson EM, Bijkerk F. Khorsand AR, et al. Opt Express. 2010 Jan 18;18(2):700-12. doi: 10.1364/OE.18.000700. Opt Express. 2010. PMID: 20173890 Free article.
Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources.
Sobierajski R, Bruijn S, Khorsand AR, Louis E, van de Kruijs RW, Burian T, Chalupsky J, Cihelka J, Gleeson A, Grzonka J, Gullikson EM, Hajkova V, Hau-Riege S, Juha L, Jurek M, Klinger D, Krzywinski J, London R, Pelka JB, Płociński T, Rasiński M, Tiedtke K, Toleikis S, Vysin L, Wabnitz H, Bijkerk F. Sobierajski R, et al. Opt Express. 2011 Jan 3;19(1):193-205. doi: 10.1364/OE.19.000193. Opt Express. 2011. PMID: 21263557 Free article.
Short period La/B and LaN/B multilayer mirrors for ~6.8 nm wavelength.
Makhotkin IA, Zoethout E, van de Kruijs R, Yakunin SN, Louis E, Yakunin AM, Banine V, Müllender S, Bijkerk F. Makhotkin IA, et al. Opt Express. 2013 Dec 2;21(24):29894-904. doi: 10.1364/OE.21.029894. Opt Express. 2013. PMID: 24514540 Free article.
Determination of optical constants of thin films in the EUV.
Ciesielski R, Saadeh Q, Philipsen V, Opsomer K, Soulié JP, Wu M, Naujok P, van de Kruijs RWE, Detavernier C, Kolbe M, Scholze F, Soltwisch V. Ciesielski R, et al. Among authors: van de kruijs rwe. Appl Opt. 2022 Mar 10;61(8):2060-2078. doi: 10.1364/AO.447152. Appl Opt. 2022. PMID: 35297898
25 results