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RBS Depth Profiling Analysis of (Ti, Al)N/MoN and CrN/MoN Multilayers.
Han B, Wang Z, Devi N, Kondamareddy KK, Wang Z, Li N, Zuo W, Fu D, Liu C. Han B, et al. Among authors: zuo w. Nanoscale Res Lett. 2017 Dec;12(1):161. doi: 10.1186/s11671-017-1921-3. Epub 2017 Mar 1. Nanoscale Res Lett. 2017. PMID: 28253563 Free PMC article.
Sputtering of silicon nanopowders by an argon cluster ion beam.
Zeng X, Pelenovich V, Wang Z, Zuo W, Belykh S, Tolstogouzov A, Fu D, Xiao X. Zeng X, et al. Among authors: zuo w. Beilstein J Nanotechnol. 2019 Jan 10;10:135-143. doi: 10.3762/bjnano.10.13. eCollection 2019. Beilstein J Nanotechnol. 2019. PMID: 30680286 Free PMC article.
Small Al cluster ion implantation into Si and 4H-SiC.
Zeng X, Pelenovich V, Ieshkin A, Danilov A, Tolstogouzov A, Zuo W, Ranjana J, Hu D, Devi N, Fu D, Xiao X. Zeng X, et al. Among authors: zuo w. Rapid Commun Mass Spectrom. 2019 Sep 30;33(18):1449-1454. doi: 10.1002/rcm.8489. Rapid Commun Mass Spectrom. 2019. PMID: 31128075
1,213 results