Thickness-Dependence Electrical Characterization of the One-Dimensional van der Waals TaSe3 Crystal.
Kim BJ, Jeong BJ, Oh S, Chae S, Choi KH, Nasir T, Lee SH, Lim HK, Choi IJ, Hong MK, Yu HK, Lee JH, Choi JY.
Kim BJ, et al. Among authors: yu hk.
Materials (Basel). 2019 Aug 2;12(15):2462. doi: 10.3390/ma12152462.
Materials (Basel). 2019.
PMID: 31382412
Free PMC article.