On the Robustness of Average Losses for Partial-Label Learning.
Lv J, Liu B, Feng L, Xu N, Xu M, An B, Niu G, Geng X, Sugiyama M.
Lv J, et al. Among authors: xu m, xu n.
IEEE Trans Pattern Anal Mach Intell. 2024 May;46(5):2569-2583. doi: 10.1109/TPAMI.2023.3275249. Epub 2024 Apr 3.
IEEE Trans Pattern Anal Mach Intell. 2024.
PMID: 37167048