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Near-field scanning optical microscope probe analysis.
Klapetek P, Bursík J, Valtr M, Martinek J. Klapetek P, et al. Among authors: valtr m. Ultramicroscopy. 2008 Jun;108(7):671-6. doi: 10.1016/j.ultramic.2007.10.014. Epub 2007 Nov 12. Ultramicroscopy. 2008. PMID: 18068903
Voice coil-based scanning probe microscopy.
Klapetek P, Valtr M, Ducho 328 V, Sobota J. Klapetek P, et al. Among authors: valtr m. Nanoscale Res Lett. 2012;7(1):332. doi: 10.1186/1556-276X-7-332. Epub 2012 Jun 21. Nanoscale Res Lett. 2012. PMID: 22720756 Free PMC article.
Large area high-speed metrology SPM system.
Klapetek P, Valtr M, Picco L, Payton OD, Martinek J, Yacoot A, Miles M. Klapetek P, et al. Among authors: valtr m. Nanotechnology. 2015 Feb 13;26(6):065501. doi: 10.1088/0957-4484/26/6/065501. Epub 2015 Jan 19. Nanotechnology. 2015. PMID: 25597347