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Short-range six-axis interferometer controlled positioning for scanning probe microscopy.
Sensors (Basel). 2014 Jan 7;14(1):877-86. doi: 10.3390/s140100877.
Sensors (Basel). 2014.
PMID: 24451463
Free PMC article.
Near-field scanning optical microscope probe analysis.
Klapetek P, Bursík J, Valtr M, Martinek J.
Klapetek P, et al. Among authors: valtr m.
Ultramicroscopy. 2008 Jun;108(7):671-6. doi: 10.1016/j.ultramic.2007.10.014. Epub 2007 Nov 12.
Ultramicroscopy. 2008.
PMID: 18068903
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Atomic force microscopy analysis of nanoparticles in non-ideal conditions.
Klapetek P, Valtr M, Nečas D, Salyk O, Dzik P.
Klapetek P, et al. Among authors: valtr m.
Nanoscale Res Lett. 2011 Aug 30;6(1):514. doi: 10.1186/1556-276X-6-514.
Nanoscale Res Lett. 2011.
PMID: 21878120
Free PMC article.
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Non-equidistant scanning approach for millimetre-sized SPM measurements.
Klapetek P, Valtr M, Buršík P.
Klapetek P, et al. Among authors: valtr m.
Nanoscale Res Lett. 2012 Apr 11;7(1):213. doi: 10.1186/1556-276X-7-213.
Nanoscale Res Lett. 2012.
PMID: 22587490
Free PMC article.
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Voice coil-based scanning probe microscopy.
Klapetek P, Valtr M, Ducho 328 V, Sobota J.
Klapetek P, et al. Among authors: valtr m.
Nanoscale Res Lett. 2012;7(1):332. doi: 10.1186/1556-276X-7-332. Epub 2012 Jun 21.
Nanoscale Res Lett. 2012.
PMID: 22720756
Free PMC article.
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Large area high-speed metrology SPM system.
Klapetek P, Valtr M, Picco L, Payton OD, Martinek J, Yacoot A, Miles M.
Klapetek P, et al. Among authors: valtr m.
Nanotechnology. 2015 Feb 13;26(6):065501. doi: 10.1088/0957-4484/26/6/065501. Epub 2015 Jan 19.
Nanotechnology. 2015.
PMID: 25597347
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How levelling and scan line corrections ruin roughness measurement and how to prevent it.
Nečas D, Valtr M, Klapetek P.
Nečas D, et al. Among authors: valtr m.
Sci Rep. 2020 Sep 17;10(1):15294. doi: 10.1038/s41598-020-72171-8.
Sci Rep. 2020.
PMID: 32943693
Free PMC article.
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Scanning Probe Microscopy controller with advanced sampling support.
Valtr M, Klapetek P, Martinek J, Novotný O, Jelínek Z, Hortvík V, Nečas D.
Valtr M, et al.
HardwareX. 2023 Jul 7;15:e00451. doi: 10.1016/j.ohx.2023.e00451. eCollection 2023 Sep.
HardwareX. 2023.
PMID: 37497345
Free PMC article.
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