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In situ bending of an Au nanowire monitored by micro Laue diffraction.
Leclere C, Cornelius TW, Ren Z, Davydok A, Micha JS, Robach O, Richter G, Belliard L, Thomas O. Leclere C, et al. Among authors: thomas o. J Appl Crystallogr. 2015 Jan 30;48(Pt 1):291-296. doi: 10.1107/S1600576715001107. eCollection 2015 Feb 1. J Appl Crystallogr. 2015. PMID: 26089751 Free PMC article.
In situ three-dimensional reciprocal-space mapping during mechanical deformation.
Cornelius TW, Davydok A, Jacques VL, Grifone R, Schülli T, Richard MI, Beutier G, Verdier M, Metzger TH, Pietsch U, Thomas O. Cornelius TW, et al. Among authors: thomas o. J Synchrotron Radiat. 2012 Sep;19(Pt 5):688-94. doi: 10.1107/S0909049512023758. Epub 2012 Jul 7. J Synchrotron Radiat. 2012. PMID: 22898946
Scanning force microscope for in situ nanofocused X-ray diffraction studies.
Ren Z, Mastropietro F, Davydok A, Langlais S, Richard MI, Furter JJ, Thomas O, Dupraz M, Verdier M, Beutier G, Boesecke P, Cornelius TW. Ren Z, et al. Among authors: thomas o. J Synchrotron Radiat. 2014 Sep;21(Pt 5):1128-33. doi: 10.1107/S1600577514014532. Epub 2014 Aug 6. J Synchrotron Radiat. 2014. PMID: 25178002 Free PMC article.
Inversion Domain Boundaries in GaN Wires Revealed by Coherent Bragg Imaging.
Labat S, Richard MI, Dupraz M, Gailhanou M, Beutier G, Verdier M, Mastropietro F, Cornelius TW, Schülli TU, Eymery J, Thomas O. Labat S, et al. Among authors: thomas o. ACS Nano. 2015 Sep 22;9(9):9210-6. doi: 10.1021/acsnano.5b03857. Epub 2015 Sep 2. ACS Nano. 2015. PMID: 26322655
673 results