Search Page
Save citations to file
Email citations
Send citations to clipboard
Add to Collections
Add to My Bibliography
Create a file for external citation management software
Your saved search
Your RSS Feed
Filters
Results by year
Table representation of search results timeline featuring number of search results per year.
Year | Number of Results |
---|---|
2017 | 1 |
2023 | 1 |
2024 | 0 |
Search Results
2 results
Results by year
Filters applied: . Clear all
Page 1
Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor.
Sensors (Basel). 2023 Sep 18;23(18):7959. doi: 10.3390/s23187959.
Sensors (Basel). 2023.
PMID: 37766015
Free PMC article.
Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method.
Chao CY, Tu H, Wu TM, Chou KY, Yeh SF, Yin C, Lee CL.
Chao CY, et al. Among authors: wu tm.
Sensors (Basel). 2017 Nov 23;17(12):2704. doi: 10.3390/s17122704.
Sensors (Basel). 2017.
PMID: 29168778
Free PMC article.
Item in Clipboard
Cite
Cite