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Variable-Wavelength Quick Scanning Nanofocused X-Ray Microscopy for In Situ Strain and Tilt Mapping.
Small. 2020 Feb;16(6):e1905990. doi: 10.1002/smll.201905990. Epub 2020 Jan 21.
Small. 2020.
PMID: 31962006
In situ compression of micropillars under coherent X-ray diffraction: a case study of experimental and data-analysis constraints.
Godard P, Verezhak M, Sadat T, Mignerot F, Jacques VLR, Le Bolloc'h D, Richter C, Berenguer F, Diaz A, Van Petegem S, Renault PO, Thilly L.
Godard P, et al. Among authors: thilly l.
J Appl Crystallogr. 2023 Feb 28;56(Pt 2):381-390. doi: 10.1107/S1600576723000493. eCollection 2023 Apr 1.
J Appl Crystallogr. 2023.
PMID: 37032969
Free PMC article.
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Size-induced twinning in InSb semiconductor during room temperature deformation.
Mignerot F, Kedjar B, Bahsoun H, Thilly L.
Mignerot F, et al. Among authors: thilly l.
Sci Rep. 2021 Oct 1;11(1):19441. doi: 10.1038/s41598-021-98492-w.
Sci Rep. 2021.
PMID: 34599209
Free PMC article.
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Revealing the role of microstructure architecture on strength and ductility of Ni microwires by in-situ synchrotron X-ray diffraction.
Purushottam Raj Purohit RRP, Arya A, Bojjawar G, Pelerin M, Van Petegem S, Proudhon H, Mukherjee S, Gerard C, Signor L, Mocuta C, Casati N, Suwas S, Chokshi AH, Thilly L.
Purushottam Raj Purohit RRP, et al. Among authors: thilly l.
Sci Rep. 2019 Jan 11;9(1):79. doi: 10.1038/s41598-018-36472-3.
Sci Rep. 2019.
PMID: 30635618
Free PMC article.
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Counting dislocations in microcrystals by coherent x-ray diffraction.
Jacques VL, Carbone D, Ghisleni R, Thilly L.
Jacques VL, et al. Among authors: thilly l.
Phys Rev Lett. 2013 Aug 9;111(6):065503. doi: 10.1103/PhysRevLett.111.065503. Epub 2013 Aug 7.
Phys Rev Lett. 2013.
PMID: 23971584
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Evidence of dislocation cross-slip in MAX phase deformed at high temperature.
Guitton A, Joulain A, Thilly L, Tromas C.
Guitton A, et al. Among authors: thilly l.
Sci Rep. 2014 Sep 15;4:6358. doi: 10.1038/srep06358.
Sci Rep. 2014.
PMID: 25220949
Free PMC article.
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