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In situ compression of micropillars under coherent X-ray diffraction: a case study of experimental and data-analysis constraints.
Godard P, Verezhak M, Sadat T, Mignerot F, Jacques VLR, Le Bolloc'h D, Richter C, Berenguer F, Diaz A, Van Petegem S, Renault PO, Thilly L. Godard P, et al. Among authors: thilly l. J Appl Crystallogr. 2023 Feb 28;56(Pt 2):381-390. doi: 10.1107/S1600576723000493. eCollection 2023 Apr 1. J Appl Crystallogr. 2023. PMID: 37032969 Free PMC article.
Revealing the role of microstructure architecture on strength and ductility of Ni microwires by in-situ synchrotron X-ray diffraction.
Purushottam Raj Purohit RRP, Arya A, Bojjawar G, Pelerin M, Van Petegem S, Proudhon H, Mukherjee S, Gerard C, Signor L, Mocuta C, Casati N, Suwas S, Chokshi AH, Thilly L. Purushottam Raj Purohit RRP, et al. Among authors: thilly l. Sci Rep. 2019 Jan 11;9(1):79. doi: 10.1038/s41598-018-36472-3. Sci Rep. 2019. PMID: 30635618 Free PMC article.