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Reliable Multivalued Conductance States in TaO x Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis.
Lee MJ, Park GS, Seo DH, Kwon SM, Lee HJ, Kim JS, Jung M, You CY, Lee H, Kim HG, Pang SB, Seo S, Hwang H, Park SK. Lee MJ, et al. Among authors: seo s, seo dh. ACS Appl Mater Interfaces. 2018 Sep 5;10(35):29757-29765. doi: 10.1021/acsami.8b09046. Epub 2018 Aug 2. ACS Appl Mater Interfaces. 2018. PMID: 30033726 Free article.
Graphene for true Ohmic contact at metal-semiconductor junctions.
Byun KE, Chung HJ, Lee J, Yang H, Song HJ, Heo J, Seo DH, Park S, Hwang SW, Yoo I, Kim K. Byun KE, et al. Among authors: seo dh. Nano Lett. 2013 Sep 11;13(9):4001-5. doi: 10.1021/nl402367y. Epub 2013 Aug 30. Nano Lett. 2013. PMID: 23978262
343 results