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Nanometre-scale 3D defects in Cr2AlC thin films.
Chen YT, Music D, Shang L, Mayer J, Schneider JM. Chen YT, et al. Among authors: schneider jm. Sci Rep. 2017 Apr 20;7(1):984. doi: 10.1038/s41598-017-01196-3. Sci Rep. 2017. PMID: 28428564 Free PMC article.
Phase stability of AlYB(14) sputtered thin films.
Kölpin H, Music D, Henkelman G, Emmerlich J, Munnik F, Schneider JM. Kölpin H, et al. Among authors: schneider jm. J Phys Condens Matter. 2009 Sep 2;21(35):355006. doi: 10.1088/0953-8984/21/35/355006. Epub 2009 Aug 7. J Phys Condens Matter. 2009. PMID: 21828627
249 results