Understanding metric-related pitfalls in image analysis validation.
Reinke A, Tizabi MD, Baumgartner M, Eisenmann M, Heckmann-Nötzel D, Kavur AE, Rädsch T, Sudre CH, Acion L, Antonelli M, Arbel T, Bakas S, Benis A, Blaschko M, Buettner F, Cardoso MJ, Cheplygina V, Chen J, Christodoulou E, Cimini BA, Collins GS, Farahani K, Ferrer L, Galdran A, van Ginneken B, Glocker B, Godau P, Haase R, Hashimoto DA, Hoffman MM, Huisman M, Isensee F, Jannin P, Kahn CE, Kainmueller D, Kainz B, Karargyris A, Karthikesalingam A, Kenngott H, Kleesiek J, Kofler F, Kooi T, Kopp-Schneider A, Kozubek M, Kreshuk A, Kurc T, Landman BA, Litjens G, Madani A, Maier-Hein K, Martel AL, Mattson P, Meijering E, Menze B, Moons KGM, Müller H, Nichyporuk B, Nickel F, Petersen J, Rafelski SM, Rajpoot N, Reyes M, Riegler MA, Rieke N, Saez-Rodriguez J, Sánchez CI, Shetty S, van Smeden M, Summers RM, Taha AA, Tiulpin A, Tsaftaris SA, Calster BV, Varoquaux G, Wiesenfarth M, Yaniv ZR, Jäger PF, Maier-Hein L.
Reinke A, et al. Among authors: sanchez ci.
ArXiv [Preprint]. 2024 Feb 23:arXiv:2302.01790v4.
ArXiv. 2024.
PMID: 36945687
Free PMC article.
Updated.
Preprint.
