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Understanding interferometry for micro-cantilever displacement detection.
von Schmidsfeld A, Nörenberg T, Temmen M, Reichling M. von Schmidsfeld A, et al. Among authors: reichling m. Beilstein J Nanotechnol. 2016 Jun 10;7:841-51. doi: 10.3762/bjnano.7.76. eCollection 2016. Beilstein J Nanotechnol. 2016. PMID: 27547601 Free PMC article.
How flat is an air-cleaved mica surface?
Ostendorf F, Schmitz C, Hirth S, Kühnle A, Kolodziej JJ, Reichling M. Ostendorf F, et al. Among authors: reichling m. Nanotechnology. 2008 Jul 30;19(30):305705. doi: 10.1088/0957-4484/19/30/305705. Epub 2008 Jun 12. Nanotechnology. 2008. PMID: 21828772
Determining cantilever stiffness from thermal noise.
Lübbe J, Temmen M, Rahe P, Kühnle A, Reichling M. Lübbe J, et al. Among authors: reichling m. Beilstein J Nanotechnol. 2013 Mar 28;4:227-33. doi: 10.3762/bjnano.4.23. Print 2013. Beilstein J Nanotechnol. 2013. PMID: 23616942 Free PMC article.
Noise in NC-AFM measurements with significant tip-sample interaction.
Lübbe J, Temmen M, Rahe P, Reichling M. Lübbe J, et al. Among authors: reichling m. Beilstein J Nanotechnol. 2016 Dec 1;7:1885-1904. doi: 10.3762/bjnano.7.181. eCollection 2016. Beilstein J Nanotechnol. 2016. PMID: 28144538 Free PMC article.
Quantitative dynamic force microscopy with inclined tip oscillation.
Rahe P, Heile D, Olbrich R, Reichling M. Rahe P, et al. Among authors: reichling m. Beilstein J Nanotechnol. 2022 Jul 6;13:610-619. doi: 10.3762/bjnano.13.53. eCollection 2022. Beilstein J Nanotechnol. 2022. PMID: 35874436 Free PMC article.
45 results