Capturing wetting states in nanopatterned silicon.
Xu X, Vereecke G, Chen C, Pourtois G, Armini S, Verellen N, Tsai WK, Kim DW, Lee E, Lin CY, Van Dorpe P, Struyf H, Holsteyns F, Moshchalkov V, Indekeu J, De Gendt S.
Xu X, et al. Among authors: pourtois g.
ACS Nano. 2014 Jan 28;8(1):885-93. doi: 10.1021/nn405621w. Epub 2014 Jan 13.
ACS Nano. 2014.
PMID: 24380402