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Determining by Raman spectroscopy the average thickness and N-layer-specific surface coverages of MoS2 thin films with domains much smaller than the laser spot size.
Wasem Klein F, Huntzinger JR, Astié V, Voiry D, Parret R, Makhlouf H, Juillaguet S, Decams JM, Contreras S, Landois P, Zahab AA, Sauvajol JL, Paillet M. Wasem Klein F, et al. Among authors: parret r. Beilstein J Nanotechnol. 2024 Mar 7;15:279-296. doi: 10.3762/bjnano.15.26. eCollection 2024. Beilstein J Nanotechnol. 2024. PMID: 38476324 Free PMC article.
Electrical monitoring of organic crystal phase transition using MoS2 field effect transistor.
Boulet I, Pascal S, Bedu F, Ozerov I, Ranguis A, Leoni T, Becker C, Masson L, Matkovic A, Teichert C, Siri O, Attaccalite C, Huntzinger JR, Paillet M, Zahab A, Parret R. Boulet I, et al. Among authors: parret r. Nanoscale Adv. 2023 Feb 14;5(6):1681-1690. doi: 10.1039/d2na00817c. eCollection 2023 Mar 14. Nanoscale Adv. 2023. PMID: 36926560 Free PMC article.
Probing the ultimate plasmon confinement limits with a van der Waals heterostructure.
Alcaraz Iranzo D, Nanot S, Dias EJC, Epstein I, Peng C, Efetov DK, Lundeberg MB, Parret R, Osmond J, Hong JY, Kong J, Englund DR, Peres NMR, Koppens FHL. Alcaraz Iranzo D, et al. Among authors: parret r. Science. 2018 Apr 20;360(6386):291-295. doi: 10.1126/science.aar8438. Science. 2018. PMID: 29674587 Free article.