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Table representation of search results timeline featuring number of search results per year.
Year | Number of Results |
---|---|
2017 | 1 |
2018 | 1 |
2021 | 4 |
2022 | 1 |
2024 | 0 |
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7 results
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Page 1
Impact of Generation and Relocation of Defects on Optical Degradation of Multi-Quantum-Well InGaN/GaN-Based Light-Emitting Diode.
Micromachines (Basel). 2022 Aug 6;13(8):1266. doi: 10.3390/mi13081266.
Micromachines (Basel). 2022.
PMID: 36014188
Free PMC article.
Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization.
Mukherjee K, De Santi C, Borga M, Geens K, You S, Bakeroot B, Decoutere S, Diehle P, Hübner S, Altmann F, Buffolo M, Meneghesso G, Zanoni E, Meneghini M.
Mukherjee K, et al. Among authors: buffolo m.
Materials (Basel). 2021 Apr 29;14(9):2316. doi: 10.3390/ma14092316.
Materials (Basel). 2021.
PMID: 33946943
Free PMC article.
Review.
Item in Clipboard
Inactivating SARS-CoV-2 Using 275 nm UV-C LEDs through a Spherical Irradiation Box: Design, Characterization and Validation.
Trivellin N, Buffolo M, Onelia F, Pizzolato A, Barbato M, Orlandi VT, Del Vecchio C, Dughiero F, Zanoni E, Meneghesso G, Crisanti A, Meneghini M.
Trivellin N, et al. Among authors: buffolo m.
Materials (Basel). 2021 Apr 29;14(9):2315. doi: 10.3390/ma14092315.
Materials (Basel). 2021.
PMID: 33946929
Free PMC article.
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Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p+n-n Diodes: The Road to Reliable Vertical MOSFETs.
Mukherjee K, De Santi C, Buffolo M, Borga M, You S, Geens K, Bakeroot B, Decoutere S, Gerosa A, Meneghesso G, Zanoni E, Meneghini M.
Mukherjee K, et al. Among authors: buffolo m.
Micromachines (Basel). 2021 Apr 16;12(4):445. doi: 10.3390/mi12040445.
Micromachines (Basel). 2021.
PMID: 33923422
Free PMC article.
Item in Clipboard
Gradual Degradation of InGaAs LEDs: Impact on Non-Radiative Lifetime and Extraction of Defect Characteristics.
Buffolo M, Magri A, De Santi C, Meneghesso G, Zanoni E, Meneghini M.
Buffolo M, et al.
Materials (Basel). 2021 Feb 27;14(5):1114. doi: 10.3390/ma14051114.
Materials (Basel). 2021.
PMID: 33673671
Free PMC article.
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Reliability of Blue-Emitting Eu2+-Doped Phosphors for Laser-Lighting Applications.
Buffolo M, De Santi C, Albertini M, Carbonera D, Rizzi GA, Granozzi G, Meneghesso G, Zanoni E, Meneghini M.
Buffolo M, et al.
Materials (Basel). 2018 Aug 28;11(9):1552. doi: 10.3390/ma11091552.
Materials (Basel). 2018.
PMID: 30154392
Free PMC article.
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Laser-Based Lighting: Experimental Analysis and Perspectives.
Trivellin N, Yushchenko M, Buffolo M, De Santi C, Meneghini M, Meneghesso G, Zanoni E.
Trivellin N, et al. Among authors: buffolo m.
Materials (Basel). 2017 Oct 11;10(10):1166. doi: 10.3390/ma10101166.
Materials (Basel). 2017.
PMID: 29019958
Free PMC article.
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