Atomic force microscopy with nanoelectrode tips for high resolution electrochemical, nanoadhesion and nanoelectrical imaging.
Nellist MR, Chen Y, Mark A, Gödrich S, Stelling C, Jiang J, Poddar R, Li C, Kumar R, Papastavrou G, Retsch M, Brunschwig BS, Huang Z, Xiang C, Boettcher SW.
Nellist MR, et al. Among authors: mark a.
Nanotechnology. 2017 Mar 3;28(9):095711. doi: 10.1088/1361-6528/aa5839.
Nanotechnology. 2017.
PMID: 28139467