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2024 | 1 |
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In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy.
J Synchrotron Radiat. 2024 Jan 1;31(Pt 1):42-54. doi: 10.1107/S1600577523010093. Epub 2024 Jan 1.
J Synchrotron Radiat. 2024.
PMID: 38095669
Free PMC article.
Wire-Based Additive Manufacturing of Ti-6Al-4V Using Electron Beam Technique.
Pixner F, Warchomicka F, Peter P, Steuwer A, Colliander MH, Pederson R, Enzinger N.
Pixner F, et al. Among authors: colliander mh.
Materials (Basel). 2020 Jul 24;13(15):3310. doi: 10.3390/ma13153310.
Materials (Basel). 2020.
PMID: 32722303
Free PMC article.
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