Ferroelectricity and Oxide Reliability of Stacked Hafnium-Zirconium Oxide Devices.
Liao RY, Chen HH, Lin PY, Liang TA, Su KH, Lin IC, Wen CH, Chou WC, Hsu HH, Cheng CH.
Liao RY, et al. Among authors: lin ic, lin py.
Materials (Basel). 2023 Apr 23;16(9):3306. doi: 10.3390/ma16093306.
Materials (Basel). 2023.
PMID: 37176188
Free PMC article.