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An ultrahigh-resolution soft x-ray microscope for quantitative analysis of chemically heterogeneous nanomaterials.
Shapiro DA, Babin S, Celestre RS, Chao W, Conley RP, Denes P, Enders B, Enfedaque P, James S, Joseph JM, Krishnan H, Marchesini S, Muriki K, Nowrouzi K, Oh SR, Padmore H, Warwick T, Yang L, Yashchuk VV, Yu YS, Zhao J. Shapiro DA, et al. Among authors: joseph jm. Sci Adv. 2020 Dec 16;6(51):eabc4904. doi: 10.1126/sciadv.abc4904. Print 2020 Dec. Sci Adv. 2020. PMID: 33328228 Free PMC article.
Three-dimensional localization of nanoscale battery reactions using soft X-ray tomography.
Yu YS, Farmand M, Kim C, Liu Y, Grey CP, Strobridge FC, Tyliszczak T, Celestre R, Denes P, Joseph J, Krishnan H, Maia FRNC, Kilcoyne ALD, Marchesini S, Leite TPC, Warwick T, Padmore H, Cabana J, Shapiro DA. Yu YS, et al. Nat Commun. 2018 Mar 2;9(1):921. doi: 10.1038/s41467-018-03401-x. Nat Commun. 2018. PMID: 29500344 Free PMC article.
A direct electron detector for time-resolved MeV electron microscopy.
Vecchione T, Denes P, Jobe RK, Johnson IJ, Joseph JM, Li RK, Perazzo A, Shen X, Wang XJ, Weathersby SP, Yang J, Zhang D. Vecchione T, et al. Among authors: joseph jm. Rev Sci Instrum. 2017 Mar;88(3):033702. doi: 10.1063/1.4977923. Rev Sci Instrum. 2017. PMID: 28372435
Femtosecond X-ray magnetic circular dichroism absorption spectroscopy at an X-ray free electron laser.
Higley DJ, Hirsch K, Dakovski GL, Jal E, Yuan E, Liu T, Lutman AA, MacArthur JP, Arenholz E, Chen Z, Coslovich G, Denes P, Granitzka PW, Hart P, Hoffmann MC, Joseph J, Le Guyader L, Mitra A, Moeller S, Ohldag H, Seaberg M, Shafer P, Stöhr J, Tsukamoto A, Nuhn HD, Reid AH, Dürr HA, Schlotter WF. Higley DJ, et al. Rev Sci Instrum. 2016 Mar;87(3):033110. doi: 10.1063/1.4944410. Rev Sci Instrum. 2016. PMID: 27036761
225 results