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Robust Local Thickness Estimation of Sub-Micrometer Specimen by 4D-STEM.
Skoupý R, Boltje DB, Slouf M, Mrázová K, Láznička T, Taisne CM, Krzyžánek V, Hoogenboom JP, Jakobi AJ. Skoupý R, et al. Among authors: hoogenboom jp. Small Methods. 2023 Sep;7(9):e2300258. doi: 10.1002/smtd.202300258. Epub 2023 May 30. Small Methods. 2023. PMID: 37248805
Optical STEM detection for scanning electron microscopy.
Kievits AJ, Duinkerken BHP, Fermie J, Lane R, Giepmans BNG, Hoogenboom JP. Kievits AJ, et al. Among authors: hoogenboom jp. Ultramicroscopy. 2024 Feb;256:113877. doi: 10.1016/j.ultramic.2023.113877. Epub 2023 Oct 30. Ultramicroscopy. 2024. PMID: 37931528 Free article.
A cryogenic, coincident fluorescence, electron, and ion beam microscope.
Boltje DB, Hoogenboom JP, Jakobi AJ, Jensen GJ, Jonker CTH, Kaag MJ, Koster AJ, Last MGF, de Agrela Pinto C, Plitzko JM, Raunser S, Tacke S, Wang Z, van der Wee EB, Wepf R, den Hoedt S. Boltje DB, et al. Among authors: hoogenboom jp. Elife. 2022 Oct 28;11:e82891. doi: 10.7554/eLife.82891. Elife. 2022. PMID: 36305590 Free PMC article.
48 results