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Determining by Raman spectroscopy the average thickness and N-layer-specific surface coverages of MoS2 thin films with domains much smaller than the laser spot size.
Wasem Klein F, Huntzinger JR, Astié V, Voiry D, Parret R, Makhlouf H, Juillaguet S, Decams JM, Contreras S, Landois P, Zahab AA, Sauvajol JL, Paillet M. Wasem Klein F, et al. Among authors: decams jm. Beilstein J Nanotechnol. 2024 Mar 7;15:279-296. doi: 10.3762/bjnano.15.26. eCollection 2024. Beilstein J Nanotechnol. 2024. PMID: 38476324 Free PMC article.
Integration of epitaxial LiNbO3thin films with silicon technology.
Bartasyte A, Oliveri S, Boujnah S, Margueron S, Bachelet R, Saint-Girons G, Albertini D, Gautier B, Boulet P, Nuta I, Blanquet E, Astié V, Decams JM. Bartasyte A, et al. Among authors: decams jm. Nanotechnology. 2024 Feb 5;35(17). doi: 10.1088/1361-6528/ad1b98. Nanotechnology. 2024. PMID: 38181437