Daniel R - Search Results

1

In-situ Observation of Cross-Sectional Microstructural Changes and Stress Distributions in Fracturing TiN Thin Film during Nanoindentation.

Zeilinger A, Todt J, Krywka C, Müller M, Ecker W, Sartory B, Meindlhumer M, Stefenelli M, Daniel R, Mitterer C, Keckes J. Zeilinger A, et al. Among authors: daniel r. Sci Rep. 2016 Mar 7;6:22670. doi: 10.1038/srep22670. Sci Rep. 2016. PMID: 26947558 Free PMC article.

2

Stress-controlled decomposition routes in cubic AlCrN films assessed by in-situ high-temperature high-energy grazing incidence transmission X-ray diffraction.

Meindlhumer M, Klima S, Jäger N, Stark A, Hruby H, Mitterer C, Keckes J, Daniel R. Meindlhumer M, et al. Among authors: daniel r. Sci Rep. 2019 Dec 2;9(1):18027. doi: 10.1038/s41598-019-54307-7. Sci Rep. 2019. PMID: 31792305 Free PMC article.

3

X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison.

Stefenelli M, Todt J, Riedl A, Ecker W, Müller T, Daniel R, Burghammer M, Keckes J. Stefenelli M, et al. Among authors: daniel r. J Appl Crystallogr. 2013 Oct 1;46(Pt 5):1378-1385. doi: 10.1107/S0021889813019535. Epub 2013 Aug 24. J Appl Crystallogr. 2013. PMID: 24068842 Free PMC article.

4

The peculiarity of the metal-ceramic interface.

Zhang Z, Long Y, Cazottes S, Daniel R, Mitterer C, Dehm G. Zhang Z, et al. Among authors: daniel r. Sci Rep. 2015 Jun 19;5:11460. doi: 10.1038/srep11460. Sci Rep. 2015. PMID: 26088014 Free PMC article.

5

X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via.

Todt J, Hammer H, Sartory B, Burghammer M, Kraft J, Daniel R, Keckes J, Defregger S. Todt J, et al. Among authors: daniel r. J Appl Crystallogr. 2016 Feb 1;49(Pt 1):182-187. doi: 10.1107/S1600576715023419. eCollection 2016 Feb 1. J Appl Crystallogr. 2016. PMID: 26937239 Free PMC article.

6

Combinatorial refinement of thin-film microstructure, properties and process conditions: iterative nanoscale search for self-assembled TiAlN nanolamellae.

Zalesak J, Todt J, Pitonak R, Köpf A, Weißenbacher R, Sartory B, Burghammer M, Daniel R, Keckes J. Zalesak J, et al. Among authors: daniel r. J Appl Crystallogr. 2016 Dec 1;49(Pt 6):2217-2225. doi: 10.1107/S1600576716017258. eCollection 2016 Dec 1. J Appl Crystallogr. 2016. PMID: 27980517 Free PMC article.

7

Biomimetic hard and tough nanoceramic Ti-Al-N film with self-assembled six-level hierarchy.

Meindlhumer M , Zalesak J , Pitonak R , Todt J , Sartory B , Burghammer M , Stark A , Schell N , Daniel R , Keckes JF , Lessiak M , Köpf A , Weißenbacher R , Keckes J . Meindlhumer M , et al. Among authors: daniel r. Nanoscale. 2019 Apr 23;11(16):7986-7995. doi: 10.1039/c8nr10339a. Nanoscale. 2019. PMID: 30969286

8

High-temperature residual stresses in thin films characterized by x-ray diffraction substrate curvature method.

Keckes J, Eiper E, Martinschitz KJ, Köstenbauer H, Daniel R, Mitterer C. Keckes J, et al. Among authors: daniel r. Rev Sci Instrum. 2007 Mar;78(3):036103. doi: 10.1063/1.2535857. Rev Sci Instrum. 2007. PMID: 17411228

9

Lateral gradients of phases, residual stress and hardness in a laser heated Ti_0.52Al_0.48N coating on hard metal.

Bartosik M, Daniel R, Zhang Z, Deluca M, Ecker W, Stefenelli M, Klaus M, Genzel C, Mitterer C, Keckes J. Bartosik M, et al. Among authors: daniel r. Surf Coat Technol. 2012 Jun 25;206(22):4502-4510. doi: 10.1016/j.surfcoat.2012.02.035. Surf Coat Technol. 2012. PMID: 23471140 Free PMC article.

10

Complementary ab initio and X-ray nanodiffraction studies of Ta₂O₅.

Hollerweger R, Holec D, Paulitsch J, Bartosik M, Daniel R, Rachbauer R, Polcik P, Keckes J, Krywka C, Euchner H, Mayrhofer PH. Hollerweger R, et al. Among authors: daniel r. Acta Mater. 2015 Jan 15;83:276-284. doi: 10.1016/j.actamat.2014.10.006. Acta Mater. 2015. PMID: 25642136 Free PMC article.

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