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Surface scattering mechanisms of tantalum nitride thin film resistor.
Chen HR, Chen YC, Chang TC, Chang KC, Tsai TM, Chu TJ, Shih CC, Chuang NC, Wang KY. Chen HR, et al. Among authors: chang tc, chang kc. Nanoscale Res Lett. 2014 Apr 11;9(1):177. doi: 10.1186/1556-276X-9-177. eCollection 2014. Nanoscale Res Lett. 2014. PMID: 24725295 Free PMC article.
Physical and chemical mechanisms in oxide-based resistance random access memory.
Chang KC, Chang TC, Tsai TM, Zhang R, Hung YC, Syu YE, Chang YF, Chen MC, Chu TJ, Chen HL, Pan CH, Shih CC, Zheng JC, Sze SM. Chang KC, et al. Among authors: chang tc, chang yf. Nanoscale Res Lett. 2015 Mar 12;10:120. doi: 10.1186/s11671-015-0740-7. eCollection 2015. Nanoscale Res Lett. 2015. PMID: 25873842 Free PMC article.
1,392 results