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Impact of Nitrogen on the Selective Closure of Stacking Faults in 3C-SiC.
Calabretta C, Scuderi V, Bongiorno C, Cannizzaro A, Anzalone R, Calcagno L, Mauceri M, Crippa D, Boninelli S, La Via F. Calabretta C, et al. Among authors: boninelli s. Cryst Growth Des. 2022 Aug 3;22(8):4996-5003. doi: 10.1021/acs.cgd.2c00515. Epub 2022 Jun 29. Cryst Growth Des. 2022. PMID: 35942119 Free PMC article.
Laser Annealing of P and Al Implanted 4H-SiC Epitaxial Layers.
Calabretta C, Agati M, Zimbone M, Boninelli S, Castiello A, Pecora A, Fortunato G, Calcagno L, Torrisi L, La Via F. Calabretta C, et al. Among authors: boninelli s. Materials (Basel). 2019 Oct 15;12(20):3362. doi: 10.3390/ma12203362. Materials (Basel). 2019. PMID: 31618862 Free PMC article.
Nanometric Moiré Stripes on the Surface of Bi2Se3 Topological Insulator.
Salvato M, Crescenzi M, Scagliotti M, Castrucci P, Boninelli S, Caruso GM, Liu Y, Mikkelsen A, Timm R, Nahas S, Black-Schaffer A, Kunakova G, Andzane J, Erts D, Bauch T, Lombardi F. Salvato M, et al. Among authors: boninelli s. ACS Nano. 2022 Sep 27;16(9):13860-13868. doi: 10.1021/acsnano.2c02515. Epub 2022 Sep 13. ACS Nano. 2022. PMID: 36098662 Free PMC article.
Mechanism of boron diffusion in amorphous silicon.
Mirabella S, De Salvador D, Bruno E, Napolitani E, Pecora EF, Boninelli S, Priolo F. Mirabella S, et al. Among authors: boninelli s. Phys Rev Lett. 2008 Apr 18;100(15):155901. doi: 10.1103/PhysRevLett.100.155901. Epub 2008 Apr 15. Phys Rev Lett. 2008. PMID: 18518128
21 results