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Error propagation in differential phase evaluation.
Opt Express. 2010 Feb 1;18(3):3199-209. doi: 10.1364/OE.18.003199.
Opt Express. 2010.
PMID: 20174159
Free article.
In situ roughness measurements for the solar cell industry using an atomic force microscope.
González-Jorge H, Alvarez-Valado V, Valencia JL, Torres S.
González-Jorge H, et al. Among authors: alvarez valado v.
Sensors (Basel). 2010;10(4):4002-9. doi: 10.3390/s100404002. Epub 2010 Apr 20.
Sensors (Basel). 2010.
PMID: 22319338
Free PMC article.
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