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Improvement of precision in refinements of structure factors using convergent-beam electron diffraction patterns taken at Bragg-excited conditions.
Acta Crystallogr A Found Adv. 2021 Jul 1;77(Pt 4):289-295. doi: 10.1107/S2053273321004137. Epub 2021 Jun 10.
Acta Crystallogr A Found Adv. 2021.
PMID: 34196291
Evaluation of TEM specimen quality prepared by focused ion beam using symmetry breaking index of convergent-beam electron diffraction.
Morikawa D, Ageishi M, Sato K, Tsuda K, Terauchi M.
Morikawa D, et al.
Microscopy (Oxf). 2021 Aug 9;70(4):394-397. doi: 10.1093/jmicro/dfab002.
Microscopy (Oxf). 2021.
PMID: 33449081
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