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ho yih tu
(8 results)?
Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor.
Sensors (Basel). 2023 Sep 18;23(18):7959. doi: 10.3390/s23187959.
Sensors (Basel). 2023.
PMID: 37766015
Free PMC article.
Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors.
Chao CY, Yeh SF, Wu MH, Chou KY, Tu H, Lee CL, Yin C, Paillet P, Goiffon V.
Chao CY, et al. Among authors: tu h.
Sensors (Basel). 2019 Dec 10;19(24):5447. doi: 10.3390/s19245447.
Sensors (Basel). 2019.
PMID: 31835566
Free PMC article.
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Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method.
Chao CY, Tu H, Wu TM, Chou KY, Yeh SF, Yin C, Lee CL.
Chao CY, et al. Among authors: tu h.
Sensors (Basel). 2017 Nov 23;17(12):2704. doi: 10.3390/s17122704.
Sensors (Basel). 2017.
PMID: 29168778
Free PMC article.
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