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Review of RF Device Behavior Model: Measurement Techniques, Applications, and Challenges.
Micromachines (Basel). 2023 Dec 25;15(1):46. doi: 10.3390/mi15010046.
Micromachines (Basel). 2023.
PMID: 38258165
Free article.
Review.
Surface-Potential-Based Compact Modeling of p-GaN Gate HEMTs.
Wang J, Chen Z, You S, Bakeroot B, Liu J, Decoutere S.
Wang J, et al.
Micromachines (Basel). 2021 Feb 15;12(2):199. doi: 10.3390/mi12020199.
Micromachines (Basel). 2021.
PMID: 33671856
Free PMC article.
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