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Temperature-Dependent HfO2/Si Interface Structural Evolution and its Mechanism.
Nanoscale Res Lett. 2019 Mar 7;14(1):83. doi: 10.1186/s11671-019-2915-0.
Nanoscale Res Lett. 2019.
PMID: 30847661
Free PMC article.
Enhanced Si Passivation and PERC Solar Cell Efficiency by Atomic Layer Deposited Aluminum Oxide with Two-step Post Annealing.
Hsu CH, Cho YS, Wu WY, Lien SY, Zhang XY, Zhu WZ, Zhang S, Chen SY.
Hsu CH, et al.
Nanoscale Res Lett. 2019 Apr 18;14(1):139. doi: 10.1186/s11671-019-2969-z.
Nanoscale Res Lett. 2019.
PMID: 31001714
Free PMC article.
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