Development of soft x-ray time-resolved photoemission spectroscopy system with a two-dimensional angle-resolved time-of-flight analyzer at SPring-8 BL07LSU

Manami Ogawa; Susumu Yamamoto; Yuka Kousa; Fumitaka Nakamura; Ryu Yukawa; Akiko Fukushima; Ayumi Harasawa; Hiroshi Kondoh; Yoshihito Tanaka; Akito Kakizaki; Iwao Matsuda

doi:10.1063/1.3687428

Development of soft x-ray time-resolved photoemission spectroscopy system with a two-dimensional angle-resolved time-of-flight analyzer at SPring-8 BL07LSU

Rev Sci Instrum. 2012 Feb;83(2):023109. doi: 10.1063/1.3687428.

Authors

Manami Ogawa¹, Susumu Yamamoto, Yuka Kousa, Fumitaka Nakamura, Ryu Yukawa, Akiko Fukushima, Ayumi Harasawa, Hiroshi Kondoh, Yoshihito Tanaka, Akito Kakizaki, Iwao Matsuda

Affiliation

¹ Institute for Solid State Physics, The University of Tokyo, 5-1-5 Kashiwanoha, Chiba 277-8581, Japan.

PMID: 22380081
DOI: 10.1063/1.3687428

Abstract

We have developed a soft x-ray time-resolved photoemission spectroscopy system using synchrotron radiation (SR) at SPring-8 BL07LSU and an ultrashort pulse laser system. Two-dimensional angle-resolved measurements were performed with a time-of-flight-type analyzer. The photoemission spectroscopy system is synchronized to light pulses of SR and laser using a time control unit. The performance of the instrument is demonstrated by mapping the band structure of a Si(111) crystal over the surface Brillouin zones and observing relaxation of the surface photo-voltage effect using the pump (laser) and probe (SR) method.