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BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits.
Sensors (Basel). 2021 Jan 26;21(3):805. doi: 10.3390/s21030805.
Sensors (Basel). 2021.
PMID: 33530334
Free PMC article.
Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect.
Perpiñà X, Altet J, Jordà X, Vellvehi M, Mestres N.
Perpiñà X, et al.
Opt Lett. 2010 Aug 1;35(15):2657-9. doi: 10.1364/OL.35.002657.
Opt Lett. 2010.
PMID: 20680090
Free article.
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