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Broadband high-energy resolution hard x-ray spectroscopy using transition edge sensors at SPring-8.
Yamada S, Ichinohe Y, Tatsuno H, Hayakawa R, Suda H, Ohashi T, Ishisaki Y, Uruga T, Sekizawa O, Nitta K, Takahashi Y, Itai T, Suga H, Nagasawa M, Tanaka M, Kurisu M, Hashimoto T, Bennett D, Denison E, Doriese WB, Durkin M, Fowler J, O'Neil G, Morgan K, Schmidt D, Swetz D, Ullom J, Vale L, Okada S, Okumura T, Azuma T, Tamagawa T, Isobe T, Kohjiro S, Noda H, Tanaka K, Taguchi A, Imai Y, Sato K, Hayashi T, Kashiwabara T, Sakata K. Yamada S, et al. Among authors: doriese wb. Rev Sci Instrum. 2021 Jan 1;92(1):013103. doi: 10.1063/5.0020642. Rev Sci Instrum. 2021. PMID: 33514202
Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer.
Nakamura N, Szypryt P, Dagel AL, Alpert BK, Bennett DA, Doriese WB, Durkin M, Fowler JW, Fox DT, Gard JD, Goodner RN, Harris JZ, Hilton GC, Jimenez ES, Kernen BL, Larson KW, Levine ZH, McArthur D, Morgan KM, O'Neil GC, Ortiz NJ, Pappas CG, Reintsema CD, Schmidt DR, Schultz PA, Thompson KR, Ullom JN, Vale L, Vaughan CT, Walker C, Weber JC, Wheeler JW, Swetz DS. Nakamura N, et al. Among authors: doriese wb. Sensors (Basel). 2024 Apr 30;24(9):2890. doi: 10.3390/s24092890. Sensors (Basel). 2024. PMID: 38732996 Free PMC article.