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2010 1
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Page 1
A Bottom-Up Volume Reconstruction Method for Atom Probe Tomography.
Ling YT, Cools S, Bogdanowicz J, Fleischmann C, Beenhouwer J, Sijbers J, Vandervorst W. Ling YT, et al. Among authors: vandervorst w. Microsc Microanal. 2022 Jan 28:1-14. doi: 10.1017/S1431927621012836. Online ahead of print. Microsc Microanal. 2022. PMID: 35088688
The flexoelectric effect in Al-doped hafnium oxide.
Celano U , Popovici M , Florent K , Lavizzari S , Favia P , Paulussen K , Bender H , di Piazza L , Van Houdt J , Vandervorst W . Celano U , et al. Among authors: vandervorst w. Nanoscale. 2018 May 10;10(18):8471-8476. doi: 10.1039/c8nr00618k. Nanoscale. 2018. PMID: 29691544
A Correlative ToF-SIMS/SPM Methodology for Probing 3D Devices.
Spampinato V, Dialameh M, Franquet A, Fleischmann C, Conard T, van der Heide P, Vandervorst W. Spampinato V, et al. Among authors: vandervorst w. Anal Chem. 2020 Aug 18;92(16):11413-11419. doi: 10.1021/acs.analchem.0c02406. Epub 2020 Aug 6. Anal Chem. 2020. PMID: 32664722
Layer-controlled epitaxy of 2D semiconductors: bridging nanoscale phenomena to wafer-scale uniformity.
Chiappe D, Ludwig J, Leonhardt A, El Kazzi S, Nalin Mehta A, Nuytten T, Celano U, Sutar S, Pourtois G, Caymax M, Paredis K, Vandervorst W, Lin D, De Gendt S, Barla K, Huyghebaert C, Asselberghs I, Radu I. Chiappe D, et al. Among authors: vandervorst w. Nanotechnology. 2018 Oct 19;29(42):425602. doi: 10.1088/1361-6528/aad798. Epub 2018 Aug 2. Nanotechnology. 2018. PMID: 30070657
Mapping interfacial excess in atom probe data.
Felfer P, Scherrer B, Demeulemeester J, Vandervorst W, Cairney JM. Felfer P, et al. Among authors: vandervorst w. Ultramicroscopy. 2015 Dec;159 Pt 2:438-44. doi: 10.1016/j.ultramic.2015.06.002. Epub 2015 Aug 22. Ultramicroscopy. 2015. PMID: 26346774
38 results