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Page 1
Growth and Crystallization of SiO2/GeO2 Thin Films on Si(100) Substrates.
Antoja-Lleonart J, Ocelík V, Zhou S, de Hond K, Koster G, Rijnders G, Noheda B. Antoja-Lleonart J, et al. Among authors: ocelik v. Nanomaterials (Basel). 2021 Jun 23;11(7):1654. doi: 10.3390/nano11071654. Nanomaterials (Basel). 2021. PMID: 34201843 Free PMC article.
Thin Films of α-Quartz GeO2 on TiO2-Buffered Quartz Substrates.
Zhou S, de Hond K, Antoja-Lleonart J, Ocelík V, Koster G, Rijnders G, Noheda B. Zhou S, et al. Among authors: ocelik v. Cryst Growth Des. 2023 Dec 18;24(1):71-78. doi: 10.1021/acs.cgd.3c00476. eCollection 2024 Jan 3. Cryst Growth Des. 2023. PMID: 38188267 Free PMC article.
Morphology of Melt-Quenched Lead Telluride Single Crystals.
Lian H, Ocelík V, Baas J, Blake GR. Lian H, et al. Among authors: ocelik v. ACS Appl Mater Interfaces. 2021 Feb 10;13(5):6241-6248. doi: 10.1021/acsami.0c20016. Epub 2021 Jan 29. ACS Appl Mater Interfaces. 2021. PMID: 33512134 Free PMC article.
A new methodology to analyze instabilities in SEM imaging.
Mansilla C, Ocelík V, De Hosson JT. Mansilla C, et al. Among authors: ocelik v. Microsc Microanal. 2014 Dec;20(6):1625-37. doi: 10.1017/S1431927614013282. Epub 2014 Oct 20. Microsc Microanal. 2014. PMID: 25327768
Orientation Relationships in Al0.7CoCrFeNi High-Entropy Alloy.
de Jeer LTH, Ocelík V, De Hosson JTM. de Jeer LTH, et al. Among authors: ocelik v. Microsc Microanal. 2017 Oct;23(5):905-915. doi: 10.1017/S1431927617012442. Epub 2017 Aug 15. Microsc Microanal. 2017. PMID: 28809133 Free PMC article.