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A GPS-Referenced Wavelength Standard for High-Precision Displacement Interferometry at λ = 633 nm.
Sensors (Basel). 2023 Feb 3;23(3):1734. doi: 10.3390/s23031734.
Sensors (Basel). 2023.
PMID: 36772774
Free PMC article.
Influence of structure geometry on THz emission from Black Silicon surfaces fabricated by reactive ion etching.
Blumröder U, Zilk M, Hempel H, Hoyer P, Pertsch T, Eichberger R, Unold T, Nolte S.
Blumröder U, et al.
Opt Express. 2017 Mar 20;25(6):6604-6620. doi: 10.1364/OE.25.006604.
Opt Express. 2017.
PMID: 28381007
Free article.
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