Tongbao Li - Search Results

Year	Number of Results
2015	1
2016	1
2021	3
2023	1
2024	0

1

Calibrate the non-orthogonal error of AFM with two-dimensional self-traceable grating.

Tan W, Tang Z, Xiao G, Yao Y, Lei L, Li Q, Jin T, Deng X, Cheng X, Li T. Tan W, et al. Among authors: li t. Ultramicroscopy. 2023 Jul;249:113734. doi: 10.1016/j.ultramic.2023.113734. Epub 2023 Apr 5. Ultramicroscopy. 2023. PMID: 37058984

2

Rectangular multilayer dielectric gratings with broadband high diffraction efficiency and enhanced laser damage resistance.

Xie L, Zhang J, Zhang Z, Ma B, Li T, Wang Z, Cheng X. Xie L, et al. Among authors: li t. Opt Express. 2021 Jan 18;29(2):2669-2678. doi: 10.1364/OE.415847. Opt Express. 2021. PMID: 33726458 Free article.

3

Hybrid application of laser-focused atomic deposition and extreme ultraviolet interference lithography methods for manufacturing of self-traceable nanogratings.

Liu J, Zhao J, Deng X, Yang S, Xue C, Wu Y, Tai R, Hu X, Dai G, Li T, Cheng X. Liu J, et al. Among authors: li t. Nanotechnology. 2021 Apr 23;32(17):175301. doi: 10.1088/1361-6528/abdcec. Nanotechnology. 2021. PMID: 33461181

4

Physical insight toward electric field enhancement at nodular defects in optical coatings.

Cheng X, Tuniyazi A, Wei Z, Zhang J, Ding T, Jiao H, Ma B, Li H, Li T, Wang Z. Cheng X, et al. Among authors: li t. Opt Express. 2015 Apr 6;23(7):8609-19. doi: 10.1364/OE.23.008609. Opt Express. 2015. PMID: 25968699 Free article.

5

Silicon epitaxy on H-terminated Si (100) surfaces at 250 °C.

Deng X, Namboodiri P, Li K, Wang X, Stan G, Myers AF, Cheng X, Li T, Silver RM. Deng X, et al. Among authors: li t. Appl Surf Sci. 2016 Aug 15;378:301-307. doi: 10.1016/j.apsusc.2016.03.212. Epub 2016 Mar 31. Appl Surf Sci. 2016. PMID: 27397949 Free PMC article.

6

A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscope.

Deng X, Dai G, Liu J, Hu X, Bergmann D, Zhao J, Tai R, Cai X, Li Y, Li T, Cheng X. Deng X, et al. Among authors: li t. Ultramicroscopy. 2021 Jul;226:113293. doi: 10.1016/j.ultramic.2021.113293. Epub 2021 May 3. Ultramicroscopy. 2021. PMID: 33993000

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