Linking structure to mechanical and elastic properties is a major concern for the development of novel electroactive materials. This work reports on the potential-induced changes in thickness and Young modulus of a substrate supported, perchlorate doped polypyrrole thin film (<100 nm) investigated with electrochemical atomic force microscopy (AFM) under in situ conditions. This was accomplished by nanomechanical mapping of potentiodynamically electropolymerized polypyrrole film in electrolyte solution with AFM during redox cycling. The polypyrrole film thickness and Young modulus follow the electrical potential nearly linearly, increasing due to solvent and ion influx as the film is oxidized, and decreasing during reduction. Our measurements also confirm the presence of a potential-independent, passive swelling which is accompanied by softening of the film, likely caused by osmotic effects. Additionally, the heterogeneous distribution of the Young modulus can be directly traced to the typical nodular surface topography of polypyrrole, with the top of the nodular area possessing lower modulus, thus highlighting the complex relationship between topography and elastic properties.
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