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Page 1
Effects of Thermal Boundary Resistance on Thermal Management of Gallium-Nitride-Based Semiconductor Devices: A Review.
Zhan T, Xu M, Cao Z, Zheng C, Kurita H, Narita F, Wu YJ, Xu Y, Wang H, Song M, Wang W, Zhou Y, Liu X, Shi Y, Jia Y, Guan S, Hanajiri T, Maekawa T, Okino A, Watanabe T. Zhan T, et al. Among authors: watanabe t. Micromachines (Basel). 2023 Nov 8;14(11):2076. doi: 10.3390/mi14112076. Micromachines (Basel). 2023. PMID: 38004933 Free PMC article. Review.
Modification and Characterization of Interfacial Bonding for Thermal Management of Ruthenium Interconnects in Next-Generation Very-Large-Scale Integration Circuits.
Zhan T, Sahara K, Takeuchi H, Yokogawa R, Oda K, Jin Z, Deng S, Tomita M, Wu YJ, Xu Y, Matsuki T, Wang H, Song M, Guan S, Ogura A, Watanabe T. Zhan T, et al. Among authors: watanabe t. ACS Appl Mater Interfaces. 2022 Feb 9;14(5):7392-7404. doi: 10.1021/acsami.1c20366. Epub 2022 Jan 31. ACS Appl Mater Interfaces. 2022. PMID: 35099170
Miniaturized planar Si-nanowire micro-thermoelectric generator using exuded thermal field for power generation.
Zhan T, Yamato R, Hashimoto S, Tomita M, Oba S, Himeda Y, Mesaki K, Takezawa H, Yokogawa R, Xu Y, Matsukawa T, Ogura A, Kamakura Y, Watanabe T. Zhan T, et al. Among authors: watanabe t. Sci Technol Adv Mater. 2018 May 24;19(1):443-453. doi: 10.1080/14686996.2018.1460177. eCollection 2018. Sci Technol Adv Mater. 2018. PMID: 29868148 Free PMC article.
Effect of the Thermal Boundary Resistance in Metal/Dielectric Thermally Conductive Layers on Power Generation of Silicon Nanowire Microthermoelectric Generators.
Zhan T, Ma S, Jin Z, Takezawa H, Mesaki K, Tomita M, Wu YJ, Xu Y, Matsukawa T, Matsuki T, Watanabe T. Zhan T, et al. Among authors: watanabe t. ACS Appl Mater Interfaces. 2020 Jul 29;12(30):34441-34450. doi: 10.1021/acsami.0c09253. Epub 2020 Jul 15. ACS Appl Mater Interfaces. 2020. PMID: 32635712
Effect of Thermal Boundary Resistance between the Interconnect Metal and Dielectric Interlayer on Temperature Increase of Interconnects in Deeply Scaled VLSI.
Zhan T, Oda K, Ma S, Tomita M, Jin Z, Takezawa H, Mesaki K, Wu YJ, Xu Y, Matsukawa T, Matsuki T, Watanabe T. Zhan T, et al. Among authors: watanabe t. ACS Appl Mater Interfaces. 2020 May 13;12(19):22347-22356. doi: 10.1021/acsami.0c03010. Epub 2020 Apr 30. ACS Appl Mater Interfaces. 2020. PMID: 32315529
11 results