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Page 1
Determination of Stiffness and the Elastic Modulus of 3D-Printed Micropillars with Atomic Force Microscopy-Force Spectroscopy.
ACS Appl Mater Interfaces. 2023 Feb 8;15(5):7602-7609. doi: 10.1021/acsami.2c21921. Epub 2023 Jan 27.
ACS Appl Mater Interfaces. 2023.
PMID: 36706051
Free PMC article.
In Situ Force Microscopy to Investigate Fracture in Stretchable Electronics: Insights on Local Surface Mechanics and Conductivity.
Cortelli G, Patruno L, Cramer T, Fraboni B, de Miranda S.
Cortelli G, et al. Among authors: de miranda s.
ACS Appl Electron Mater. 2022 Jun 28;4(6):2831-2838. doi: 10.1021/acsaelm.2c00328. Epub 2022 Jun 14.
ACS Appl Electron Mater. 2022.
PMID: 35782155
Free PMC article.
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Atomic Force Microscopy Nanomechanics of Hard Nanometer-Thick Films on Soft Substrates: Insights into Stretchable Conductors.
Cortelli G, Patruno L, Cramer T, Murgia M, Fraboni B, de Miranda S.
Cortelli G, et al. Among authors: de miranda s.
ACS Appl Nano Mater. 2021 Aug 27;4(8):8376-8382. doi: 10.1021/acsanm.1c01590. Epub 2021 Jul 20.
ACS Appl Nano Mater. 2021.
PMID: 34485845
Free PMC article.
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Direct imaging of defect formation in strained organic flexible electronics by Scanning Kelvin Probe Microscopy.
Cramer T, Travaglini L, Lai S, Patruno L, de Miranda S, Bonfiglio A, Cosseddu P, Fraboni B.
Cramer T, et al. Among authors: de miranda s.
Sci Rep. 2016 Dec 2;6:38203. doi: 10.1038/srep38203.
Sci Rep. 2016.
PMID: 27910889
Free PMC article.
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