Search Page
Save citations to file
Email citations
Send citations to clipboard
Add to Collections
Add to My Bibliography
Create a file for external citation management software
Your saved search
Your RSS Feed
Filters
Results by year
Table representation of search results timeline featuring number of search results per year.
Year | Number of Results |
---|---|
2011 | 1 |
2020 | 1 |
2024 | 0 |
Search Results
2 results
Results by year
Filters applied: . Clear all
It looks like you are searching for an author.
Results are currently sorted by Best Match. To see the newest results first,
change the sort order to Most Recent.
Page 1
Cathodoluminescence Spectroscopic Stress Analysis for Silicon Oxide Film and Its Damage Evaluation.
Materials (Basel). 2020 Oct 10;13(20):4490. doi: 10.3390/ma13204490.
Materials (Basel). 2020.
PMID: 33050445
Free PMC article.
In-situ cathodoluminescence spectroscopy of silicon oxide thin film under uniaxial tensile loading.
Namazu T, Yamashita N, Kakinuma S, Nishikata K, Naka N, Matsumoto K, Inoue S.
Namazu T, et al. Among authors: kakinuma s.
J Nanosci Nanotechnol. 2011 Apr;11(4):2861-6. doi: 10.1166/jnn.2011.3902.
J Nanosci Nanotechnol. 2011.
PMID: 21776644
Item in Clipboard
Cite
Cite