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Impact of Photo-Excitation on Leakage Current and Negative Bias Instability in InSnZnO Thickness-Varied Thin-Film Transistors.
Nanomaterials (Basel). 2020 Sep 9;10(9):1782. doi: 10.3390/nano10091782.
Nanomaterials (Basel). 2020.
PMID: 32916832
Free PMC article.
Understanding the Role of Temperature and Drain Current Stress in InSnZnO TFTs with Various Active Layer Thicknesses.
Wang D, Furuta M, Tomai S, Yano K.
Wang D, et al. Among authors: tomai s.
Nanomaterials (Basel). 2020 Mar 27;10(4):617. doi: 10.3390/nano10040617.
Nanomaterials (Basel). 2020.
PMID: 32230775
Free PMC article.
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