Search Page
Save citations to file
Email citations
Send citations to clipboard
Add to Collections
Add to My Bibliography
Create a file for external citation management software
Your saved search
Your RSS Feed
Filters
Results by year
Table representation of search results timeline featuring number of search results per year.
Year | Number of Results |
---|---|
2015 | 1 |
2021 | 1 |
2024 | 0 |
Search Results
2 results
Results by year
Filters applied: . Clear all
It looks like you are searching for an author.
Results are currently sorted by Best Match. To see the newest results first,
change the sort order to Most Recent.
Page 1
Resistive Switching Characteristics of Atomic-Layer-Deposited Y2O3 Insulators with Deposition Temperature.
J Nanosci Nanotechnol. 2015 Oct;15(10):7586-9. doi: 10.1166/jnn.2015.11163.
J Nanosci Nanotechnol. 2015.
PMID: 26726377
Microstructures of HfOx Films Prepared via Atomic Layer Deposition Using La(NO3)3·6H2O Oxidants.
Kim SY, Jung YC, Seong S, Lee T, Park IS, Ahn J.
Kim SY, et al. Among authors: seong s.
Materials (Basel). 2021 Dec 6;14(23):7478. doi: 10.3390/ma14237478.
Materials (Basel). 2021.
PMID: 34885632
Free PMC article.
Item in Clipboard
Cite
Cite