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Table representation of search results timeline featuring number of search results per year.
Year | Number of Results |
---|---|
2019 | 2 |
2021 | 2 |
2023 | 1 |
2024 | 1 |
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Page 1
Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data.
Sensors (Basel). 2023 Feb 8;23(4):1889. doi: 10.3390/s23041889.
Sensors (Basel). 2023.
PMID: 36850488
Free PMC article.
Surface Analysis of Amorphous Carbon Thin Film for Etch Hard Mask.
Kim KP, Song WS, Park MK, Hong SJ.
Kim KP, et al. Among authors: hong sj.
J Nanosci Nanotechnol. 2021 Mar 1;21(3):2032-2038. doi: 10.1166/jnn.2021.18919.
J Nanosci Nanotechnol. 2021.
PMID: 33404489
Item in Clipboard
Optimizing Binding Site Spacing in Fluidic Self-Assembly for Enhanced Microchip Integration Density.
Park M, Yoo B, Hong M, Cho D, Jeong Y, Park C, Kim J, Ha TM, Kim G, Hong SJ, Lee D.
Park M, et al. Among authors: hong sj.
Micromachines (Basel). 2024 Feb 22;15(3):300. doi: 10.3390/mi15030300.
Micromachines (Basel). 2024.
PMID: 38542547
Free PMC article.
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Surface Analysis of TMCTS-Based SiOC(H) Low-k Dielectrics in Post-Etch Strip of ACL Hardmask.
Park MK, Song WS, Kim MH, Hong SJ.
Park MK, et al. Among authors: hong sj.
Materials (Basel). 2021 Feb 28;14(5):1144. doi: 10.3390/ma14051144.
Materials (Basel). 2021.
PMID: 33670915
Free PMC article.
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Performance Evaluation of RF Generators with In-Situ Plasma Process Monitoring Sensors.
Jo KJ, Hong SJ.
Jo KJ, et al. Among authors: hong sj.
J Nanosci Nanotechnol. 2019 Oct 1;19(10):6499-6505. doi: 10.1166/jnn.2019.17057.
J Nanosci Nanotechnol. 2019.
PMID: 31026984
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Analysis of Optical Plasma Monitoring in Plasma-Enhanced Atomic Layer Deposition Process of Al₂O₃.
Arshad MZ, Tak HW, Kim HG, Hong SJ.
Arshad MZ, et al. Among authors: hong sj.
J Nanosci Nanotechnol. 2019 Mar 1;19(3):1657-1665. doi: 10.1166/jnn.2019.16198.
J Nanosci Nanotechnol. 2019.
PMID: 30469240
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