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Page 1
Surface topography analysis with application of roughness area dependence method.
Ultramicroscopy. 2016 Nov;170:77-85. doi: 10.1016/j.ultramic.2016.07.017. Epub 2016 Aug 16.
Ultramicroscopy. 2016.
PMID: 27552436
Nanostructuring of Si substrates by a metal-assisted chemical etching and dewetting process.
Stafiniak A, Prażmowska J, Macherzyński W, Paszkiewicz R.
Stafiniak A, et al. Among authors: paszkiewicz r.
RSC Adv. 2018 Sep 5;8(54):31224-31230. doi: 10.1039/c8ra03711f. eCollection 2018 Aug 30.
RSC Adv. 2018.
PMID: 35548763
Free PMC article.
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SbSI Nanosensors: from Gel to Single Nanowire Devices.
Mistewicz K, Nowak M, Paszkiewicz R, Guiseppi-Elie A.
Mistewicz K, et al. Among authors: paszkiewicz r.
Nanoscale Res Lett. 2017 Dec;12(1):97. doi: 10.1186/s11671-017-1854-x. Epub 2017 Feb 7.
Nanoscale Res Lett. 2017.
PMID: 28176288
Free PMC article.
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