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2019 | 1 |
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Page 1
Random-phase-shift Fizeau interferometer.
Appl Opt. 2011 Dec 20;50(36):6564-75. doi: 10.1364/AO.50.006564.
Appl Opt. 2011.
PMID: 22193185
Tip wear and tip breakage in high-speed atomic force microscopes.
Strahlendorff T, Dai G, Bergmann D, Tutsch R.
Strahlendorff T, et al. Among authors: tutsch r.
Ultramicroscopy. 2019 Jun;201:28-37. doi: 10.1016/j.ultramic.2019.03.013. Epub 2019 Mar 22.
Ultramicroscopy. 2019.
PMID: 30925297
Free article.
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True 3D Nanometrology: 3D-Probing with a Cantilever-Based Sensor.
Thiesler J, Ahbe T, Tutsch R, Dai G.
Thiesler J, et al. Among authors: tutsch r.
Sensors (Basel). 2021 Dec 31;22(1):314. doi: 10.3390/s22010314.
Sensors (Basel). 2021.
PMID: 35009855
Free PMC article.
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